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Physical principles of electron microscopy an introduction to TEM, SEM and AEM

By: Publication details: New York Springer 2005 2005Description: ix,202p. 24cmISBN:
  • 9780387258000
Subject(s): DDC classification:
  • 502.825 EGE
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Cover image Item type Current library Home library Collection Shelving location Call number Materials specified Vol info URL Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Schedule Reference Materials Main Library Reference Section Schedule Reference Collection 502.825EGE (Browse shelf(Opens below)) Available 21497

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