00310    a2200109   4500020001500000082001900015100002100034245006400055260003700119300001900156650002500175  a0780310004  a621.39732bSHA  aSharma, Ashok K.  aSemiconductor memories btechnology testing and reliability  aNew YorkbJohn Willyc1997g1997  axi,462p.c26cm  aSEMICONDUCTOR MEMORY