Saunders, Anthony <br/><br/>
Credit risk measurement  new approaches to value at risk and other paradigms 

 - 2nd  
 - New York  John Wiley  2002 
 - xiii, 319p.  24cm 
<br/><br/><label>ISBN: </label>047121910X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>GENERAL MANAGEMENT
<br/><br/><label>Dewey Class. No.: </label>658.155  / SAU