Zhang, Sam <br/><br/>
Materials characterization techniques 

 - New York  CRC Press  2009 
 - 328p.  23cm. 
<br/><br/><label>ISBN: </label>9781498770460 
<br/><br/><label>Subjects--Topical Terms: </label><br/>XPS application<br/>X-ray<br/>Micro thermal microscopy
<br/><br/><label>Dewey Class. No.: </label>620.110287  / ZHA