000 00416 a2200145 4500
020 _a9780387258000
082 _a502.825
_bEGE
090 _c1875
_d2202
100 _aEgerton, Ray F.
245 _aPhysical principles of electron microscopy
_ban introduction to TEM, SEM and AEM
260 _aNew York
_bSpringer
_c2005
_g2005
300 _aix,202p.
_c24cm
650 _aNATURAL SCIENCES AND MATHEMATICS
942 _cSR
999 _c30991
_d30991