000 00392 a2200145 4500
020 _a8120316835
082 _a621.39732
_bSHA
090 _c13488
_d55669
100 _aSharma, Ashok K.
245 _aSemiconductor memories
_btechnology testing and reliability
260 _aNew Delhi
_bPrentice-Hall
_c1997
_g1997
300 _aix, 462p.
_c24cm.
650 _aSEMICONDUCTOR MEMORY
942 _cL
999 _c41819
_d41819